Nano-structured thin films characterized by high-temperature X-ray diffraction

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...

Characterization of Thin Films by Glancing Incidence X-ray Diffraction

Two dimensional materials created ab-initio by the process of condensation of atoms, molecules or ions, called thin films, have unique properties significantly different from the corresponding bulk materials as a result of their physical dimensions, geometry, non-equilibrium microstructure and metallurgy. These characteristic features of thin films can be drastically modified and tailored to ob...

nano-structural characterization of post-annealed zno thin films by x-ray diffraction and field emission scanning electron microscopy

zno thin films were deposited on si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°c). dependence of the crystallographic structure, nano-strain, chemical composition and surface physical morphology of these layers on annealing temperature were studied. the crystallographic structure of films was studied using x-ray diffracti...

High temperature X-ray diffraction apparatus.